[YangMing] TEM: JEM-1400plus

• Update Date：2026-06-30
• Units：Instrumentation Resource Center

[YangMing] FE-SEM: JSM-7600F

• Update Date：2026-06-30
• Units：Instrumentation Resource Center

[Guangfu] FE-SEM: JSM-6700F

• Update Date：2026-06-01
• Units：Instrumentation Resource Center

[Guangfu] SEM (JSM IT-300) and EBL

• Update Date：2025-06-18
• Units：Instrumentation Resource Center

[Guangfu] Closed-Cycle Low-Temperature Scanning Probe Microscopy

• Update Date：2025-03-31
• Units：Instrumentation Resource Center

[Guangfu] SEM: S-4700I

• Update Date：2025-02-20
• Units：Instrumentation Resource Center

[Guangfu] E-beam inspection tool, eScan310

• Update Date：2023-10-30
• Units：Instrumentation Resource Center