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NYCU Office of Research and Development

Basic Service-Material

Field Emission Transmission Electron Microscope (FE-TEM)

  • Update Date:2025-04-23
  • Units:Instrumentation Resource Center

X-ray Photoelectron and Auger Electron Epectroscopy

  • Update Date:2024-02-06
  • Units:Instrumentation Resource Center

High Resolution Dual-Beam Focused Ion Beam Microscope

  • Update Date:2025-06-23
  • Units:Instrumentation Resource Center
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